Small Electronic Component Leak Test System LZ-3000
Achieving automation of high-speed and high-precision gloss leak testing.
The increasingly miniaturized SMD crystal devices. The LZ-3000 series is an automatic leak inspection system developed to meet the demand for high-speed processing in gross leak testing of small electronic components, including hermetically sealed SMD crystal devices. We provide the optimal system for enhancing your production efficiency and improving your quality control system.
